BIEXCITON EMISSION FROM THICK ZNSE EPILAYER GROWN BY MOLECULAR-BEAM EPITAXY

Citation
Is. Hauksson et al., BIEXCITON EMISSION FROM THICK ZNSE EPILAYER GROWN BY MOLECULAR-BEAM EPITAXY, Journal of applied physics, 83(4), 1998, pp. 2035-2040
Citations number
22
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00218979
Volume
83
Issue
4
Year of publication
1998
Pages
2035 - 2040
Database
ISI
SICI code
0021-8979(1998)83:4<2035:BEFTZE>2.0.ZU;2-T
Abstract
Photoemission under high photoexcitation in thick ZnSe epilayer grown by molecular beam epitaxy (MBE) has been investigated using time-resol ved photoluminescence spectroscopy. The presence of biexcitons is demo nstrated under picosecond pulsed excitation as biexciton emission is o bserved 4 meV below the free exciton emission. The rise time of the bi exciton emission follows the rise time of the free exciton and decays with a single exponential form with shorter lifetime than the free exc iton. This clear observation of biexciton luminescence in MBE grown Zn Se epilayer, suggests that spontaneous emission commonly observed at l asing threshold under optical pumping at low temperatures is due to bi exciton recombination. (C) 1998 American Institute of Physics.