PHYSICAL-PROPERTIES OF OSMIUM DOPED TIN OXIDE THIN-FILMS

Citation
R. Rella et al., PHYSICAL-PROPERTIES OF OSMIUM DOPED TIN OXIDE THIN-FILMS, Journal of applied physics, 83(4), 1998, pp. 2369-2371
Citations number
11
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00218979
Volume
83
Issue
4
Year of publication
1998
Pages
2369 - 2371
Database
ISI
SICI code
0021-8979(1998)83:4<2369:POODTO>2.0.ZU;2-L
Abstract
The sol-gel process has been used to prepare osmium doped tin oxide th in films. The energy gap and refractive index were evaluated from opti cal measurements. Electrical characterization has been performed in a controlled atmosphere in order to investigate the influence of methane on the electrical conductance. New results have been obtained that ma ke tin oxide doped with osmium a very interesting material for fabrica tion of low power consumption sensors for methane detection. (C) 1998 American Institute of Physics.