Xz. Dang et al., PERSISTENT PHOTOCONDUCTIVITY AND DEFECT LEVELS IN N-TYPE ALGAN GAN HETEROSTRUCTURES/, Applied physics letters, 72(21), 1998, pp. 2745-2747
Persistent photoconductivity effects have been characterized in n-type
Al0.15Ga0.85N/GaN heterostructures using both monochromatic light and
room light illumination. Time constants of similar to 1 x 10(4) s hav
e been observed, and measurements of photocurrent specta performed usi
ng various illumination geometries and techniques have shown that defe
ct levels exist rn both the Al0.15Ga0.85N and GaN layers. Broad distri
butions of defect levels with excitation energies lower than the bandg
ap energies are found in both Al0.15Ga0.85N and GaN, and evidence is o
bserved that these levels contribute significantly to the aforemention
ed persistent photoconductivity effects. The photocurrent spectra also
reveal the presence of a level with an excitation energy of' 3.36 eV
that contributes to the persistent photoconductivity in the heterostru
cture. (C) 1988 American Institute of Physics.