FABRICATION AND OPTICAL CHARACTERIZATION OF PB(MG1 3NB2/3)O-3-PBTIO3 PLANAR THIN-FILM OPTICAL WAVE-GUIDES/

Citation
Yl. Lu et al., FABRICATION AND OPTICAL CHARACTERIZATION OF PB(MG1 3NB2/3)O-3-PBTIO3 PLANAR THIN-FILM OPTICAL WAVE-GUIDES/, Applied physics letters, 72(23), 1998, pp. 2927-2929
Citations number
13
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00036951
Volume
72
Issue
23
Year of publication
1998
Pages
2927 - 2929
Database
ISI
SICI code
0003-6951(1998)72:23<2927:FAOCOP>2.0.ZU;2-H
Abstract
Highly (110)-oriented and (100) nearly epitaxial 0.7PMN-0.3PT thin fil ms were deposited on (1012) sapphire and (100) LaAlO3 substrates, resp ectively, using a dip-coating method. Optical waveguide characterizati on and electro-optic effect measurements of the film on sapphire subst rate were demonstrated. Low propagation loss of 4.1 dB/cm and high qua dratic electro-optic coefficient of 0.75 x 10(-16) (m/V)(2) were obtai ned at wavelength of 632.8 nm. Epitaxial PMN-PT thin films will be sui table for integrated optic devices. (C) 1998 American Institute of Phy sics.