J. Lee et al., BUILT-IN VOLTAGES AND ASYMMETRIC POLARIZATION SWITCHING IN PB(ZR,TI)O-3 THIN-FILM CAPACITORS, Applied physics letters, 72(25), 1998, pp. 3380-3382
Asymmetric polarization switching of Pb(Zr,Ti)O-3 (PZT) thin films wit
h different electrode configuration has been studied in (La,Sr)CoO3/Pb
(Zr,Ti)O-3/(La,Sr)CoO3 (LSCO) heterostructures in which the conducting
oxide (La,Sr)CoO3 and/or LaCoO3 (LCO) have been used as an electrode.
Polarization-voltage (P-V) hysteresis loop of LSCO/PZT/LSCO was symme
tric. However, LCO/ PZT/LSCO showed a largely asymmetric P-V hysteresi
s loop and large relaxation of the remanent polarization at the negati
vely poled state, eventually leading to an imprint failure. On the oth
er hand, LSCO/PZT/LCO exhibited large relaxation of the positively pol
ed state. The asymmetric behavior of the polarized states implies the
presence of an internal electric field inside the PZT layer. It is sug
gested that the internal electric field is caused by built-in voltages
at LCO/PZT and LSCO/PZT interfaces. The built-in voltages at LCO/PZT
and LSCO/PZT interfaces were 0.6 V and 0.12 V, respectively. (C) 1998
American Institure of Physics. [S0003-6951(98)04625-7].