ELECTRON-CYCLOTRON-RESONANCE PLASMA ION-SOURCE FOR MATERIAL DEPOSITIONS

Citation
M. Delaunay et E. Touchais, ELECTRON-CYCLOTRON-RESONANCE PLASMA ION-SOURCE FOR MATERIAL DEPOSITIONS, Review of scientific instruments, 69(6), 1998, pp. 2320-2324
Citations number
24
Categorie Soggetti
Physics, Applied","Instument & Instrumentation
ISSN journal
00346748
Volume
69
Issue
6
Year of publication
1998
Pages
2320 - 2324
Database
ISI
SICI code
0034-6748(1998)69:6<2320:EPIFMD>2.0.ZU;2-2
Abstract
An electron cyclotron resonance (ECR) plasma has been used in conjunct ion with solid metal targets for deposition of various metal and oxide compounds. A large microwave system provides dense and high-quality f ilms at low gas pressures with a plasma generation independent on the sputtering process. The 2.45 GHz microwave power is introduced in the reactor via two separate rectangular waveguides and the plasma cross s ection is 20X5 cm(2) in area. High plasma densities over 4X10(11) cm(- 3) were measured by interferometry. An iron deposition rate of 2000 An gstrom/mn has been achieved. Transparent aluminum oxide Al2O3 films wi th a refractive index of 1.57 were obtained under a deposition rate of 150 Angstrom/mn. The association of several rectangular plasma chambe rs similar to the elementary plasma source used in this work is discus sed. Direct metal ion production was also investigated in such a waveg uide plasma source. Metal vaporization and ionization have been provid ed by energetic electrons from the ECR surface. Thus, a Zn+ ion curren t density of 30 mA/cm(2) has been reached without support gas. (C) 199 8 American Institute of Physics. [S0034-6748(98)05506-3].