Jm. Bonard et al., COMBINED TRANSMISSION ELECTRON-MICROSCOPY AND CATHODOLUMINESCENCE STUDIES OF DEGRADATION IN ELECTRON-BEAM-PUMPED ZN1-XCDXSE ZNSE BLUE-GREENLASERS/, Journal of applied physics, 84(3), 1998, pp. 1263-1273
We explored degradation in electron-beam-pumped Zn1-xCdxSe/ZnSe laser
structures by combining cathodoluminescence (CL) measurements in a sca
nning electron microscope with transmission electron microscopy. The r
ate of degradation, measured as the decrease of the emitted CL intensi
ty under electron bombardment, depends critically on the threading dis
location density and on the strain in the quantum well. Degradation oc
curs via the formation of dark spot defects, which are related to bomb
ardment-induced networks of dislocation loops in the quantum well. The
se degradation defects often initiate where threading dislocations cro
ss the quantum well. We propose a self-supporting dislocation climb me
chanism activated by nonradiative recombination to explain the formati
on and propagation of the degradation defects. (C) 1998 American Insti
tute of Physics.