High-resolution transmission electron microscopy (HRTEM) shows that am
orphous-tetrahedral diamond like carbon (a-tC) films grown by pulsed-l
aser deposition on Si(100) consist of three-to-four layers, depending
on the growth energetics. We estimate the density of each layer using
both HRTEM image contrast and Rutherford backscattering spectrometry.
The first carbon layer and final surface layer have relatively low den
sity. The bulk of the film between these two layers has higher density
. For films grown under the most energetic conditions, there exists a
superdense a-tC layer between the interface and bulk layers. The densi
ty of all four layers, and the thickness of the surface and interfacia
l layers, correlate well with the energetics of the depositing carbon
species. (C) 1998 American Institute of Physics.