STRAIN COMPENSATED INGAAS INGAP QUANTUM-WELL INFRARED DETECTOR FOR MIDWAVELENGTH BAND DETECTION/

Citation
S. Maimon et al., STRAIN COMPENSATED INGAAS INGAP QUANTUM-WELL INFRARED DETECTOR FOR MIDWAVELENGTH BAND DETECTION/, Applied physics letters, 73(6), 1998, pp. 800-802
Citations number
19
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00036951
Volume
73
Issue
6
Year of publication
1998
Pages
800 - 802
Database
ISI
SICI code
0003-6951(1998)73:6<800:SCIIQI>2.0.ZU;2-V
Abstract
A high detectivity multiquantum well midinfrared photodetector is repo rted. It is based on a strain compensated InGaAs/InGaP on InP structur e, using bound-to-continuum intersubband absorption, with lambda(P)=4. 9 mu m and similar to 0.5 mu m full width at half maximum. This design is unique by enabling a large critical thickness, thus increasing the quantum efficiency. Photodetectors with background-limited performanc e (BLIP) with detectivity of D-lambda(BLIP) = 3.2X10(10) cm root<(Hz) over bar>/W up to 110 K, with only ten quantum well periods were imple mented. Arguments are given to predict an optimized background-limited performance for this design up to 135 K. (C) 1998 American Institute of Physics. [S0003-6951(98)03132-5].