PATHWAYS FOR INITIAL WATER-INDUCED OXIDATION OF SI(100)

Citation
Bb. Stefanov et K. Raghavachari, PATHWAYS FOR INITIAL WATER-INDUCED OXIDATION OF SI(100), Applied physics letters, 73(6), 1998, pp. 824-826
Citations number
16
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00036951
Volume
73
Issue
6
Year of publication
1998
Pages
824 - 826
Database
ISI
SICI code
0003-6951(1998)73:6<824:PFIWOO>2.0.ZU;2-V
Abstract
First-principles molecular orbital methods and gradient-corrected dens ity functional calculations on silicon clusters are used to study poss ible pathways for the initial oxidation of Si (100)-2X1. In these reac tions, the adsorbed hydroxyl oxygen inserts into the dimer Si-Si bond to form a suboxide (=Si-O-Si=) surface structure. The reaction typical ly follows a two-step pathway involving an intermediate energy minimum . In the case of an ideal surface with full water coverage, the reacti on is exothermic by 1.3 eV and the overall reaction barrier is estimat ed at 2.4 eV. However, an alternative pathway involving a dangling bon d site lowers the activation barrier to 2.1 eV. The implications for t he oxidation reaction rates are discussed as well as possible alternat ive pathways. (C) 1998 American Institute of Physics.