Characterization of second phase particles is important with regard to
Their influence on mechanical properties of materials. Analytical ele
ctron microscopy offers the possibility to achieve complete characteri
zation of inclusions. Complete characterization of inclusions means qu
antitative evaluation of their chemistry and the stereological paramet
ers. A characterization technique based on integrated microscopy and i
nvolving scanning electron microscopy, image analysis and energy dispe
rsive X-ray spectrometry is presented. A discussion of the use of tran
smission electron microscopy and electron energy loss spectroscopy is
also presented for the characterization of very small particles and co
mpounds (> 100 nm).