X. Xu et al., CLUSTER MODELING OF METAL-OXIDES - THE INFLUENCE OF THE SURROUNDING POINT CHARGES ON THE EMBEDDED-CLUSTER, Chemical physics letters, 292(3), 1998, pp. 282-288
An ab initio study has been performed to investigate the influence of
the surrounding point charges on the calculated electronic properties
of the embedded NiO cluster. The employment of the nominal charges +/-
2.0 would cause overestimation of the crystal potential even for the
so-called ionic oxide NiO. Several criteria, namely, the charge, poten
tial, dipole moment and charge density consistence for determining the
magnitude of point charges self-consistently have been proposed and e
xamined. When the embedding point charges are spherically expanded, gi
ving the embedding point charges a continuous distribution of charge d
ensity, a good agreement is reached between the calculated properties
of the embedded cluster model and those of the bulk solid after charge
density consistence is fulfilled. (C) 1998 Elsevier Science B.V. All
rights reserved.