ON-CHIP CROSS-TALK NOISE MODEL FOR DEEP-SUBMICROMETER ULSI INTERCONNECT

Authors
NAKAGAWA SO SYLVESTER DM MCBRIDE JG OH SY
Citation
So. Nakagawa et al., ON-CHIP CROSS-TALK NOISE MODEL FOR DEEP-SUBMICROMETER ULSI INTERCONNECT, HEWLETT-PAC, 49(3), 1998, pp. 39-45
Citations number
9
Categorie Soggetti
Engineering, Eletrical & Electronic","Instument & Instrumentation","Computer Science Hardware & Architecture
Journal title
HEWLETT-PACKARD JOURNAL
ISSN journal
00181153 → ACNP
Volume
49
Issue
3
Year of publication
1998
Pages
39 - 45
Database
ISI
SICI code
0018-1153(1998)49:3<39:OCNMFD>2.0.ZU;2-M
Abstract
A Simple closed-form model for calculating cross talk noise on signal lines in deep-submicrometer interconnect systems has accuracy comparab le to SP CE for an arbitrary ramp input rate. Interconnect resistance, interconnect capacitance. and driver resistance are ail taken into ac count. The model is suitable for rapid cross talk estimation and signa l integrity verification.