Vf. Antyushin et al., SURFACE MOBILITY AND DISTRIBUTION OF ELECTRONS IN THE ACCUMULATION LAYER OF GA2SE3 GAAS HETEROSTRUCTURES/, Semiconductors (Woodbury, N.Y.), 32(6), 1998, pp. 646-648
The dependence of the electron drift mobility in the undepleted conduc
tion channels of Ga2Se3/GaAs heterostructures on the surface charge de
nsity is measured. The presence of charge coupling in the accumulation
layer sufficient for creating electrical (or microelectronic) devices
is discovered. (C) 1998 American Institute of Physics.