The crystal direction of CdS thin films produced by the laser ablation
was measured using X-ray diffractometer (XRD). The results reveal tha
t the direction of the CdS crystal depends considerably on the substra
te temperature and laser energy density. The c-axis of the CdS crystal
changed from perpendicular to parallel with the surface as the laser
energy density increased, The parallality of c-axis may be due to the
clusters included ir. the laser plume. On the other hand, the c-axis c
hanged from parallel to perpendicular as the substrate temperature inc
reased. This phenomenon is considered to be that the clusters on the s
ubstrate melting and re-crystallizing at the film surface due to the h
igh temperature prevailing during laser ablation.