A SCANNING-TRANSMISSION X-RAY MICROSCOPE FOR MATERIALS SCIENCE SPECTROMICROSCOPY AT THE ADVANCED LIGHT-SOURCE

Authors
WARWICK T FRANCK K KORTRIGHT JB MEIGS G MORONNE M MYNENI S ROTENBERG E SEAL S STEELE WF ADE H GARCIA A CERASARI S DELINGER J HAYAKAWA S HITCHCOCK AP TYLISZCZAK T KIKUMA J RIGHTOR EG SHIN HJ TONNER BP
Citation
T. Warwick et al., A SCANNING-TRANSMISSION X-RAY MICROSCOPE FOR MATERIALS SCIENCE SPECTROMICROSCOPY AT THE ADVANCED LIGHT-SOURCE, Review of scientific instruments, 69(8), 1998, pp. 2964-2973
Citations number
16
Categorie Soggetti
Physics, Applied","Instument & Instrumentation
Journal title
Review of scientific instruments → ACNP
ISSN journal
00346748
Volume
69
Issue
8
Year of publication
1998
Pages
2964 - 2973
Database
ISI
SICI code
0034-6748(1998)69:8<2964:ASXMFM>2.0.ZU;2-O
Abstract
Design and performance of a scanning transmission x-ray microscope (ST XM) at the Advanced Light Source is described. This instrument makes u se of a high brightness undulator beamline and extends the STXM techni que to new areas of research. After 2.5 years of development it is now an operational tool for research in polymer science, environmental ch emistry, and magnetic materials. (C) 1998 American Institute of Physic s.