Cjgj. Uiterwaal et al., SELF-CALIBRATING METHOD FOR MEASURING LOCAL MULTIPHOTON-IONIZATION YIELDS AS A FUNCTION OF ABSOLUTE INTENSITY, Physical review. A, 58(2), 1998, pp. 1592-1594
We present a self-calibrating method for measuring local multiphoton-i
onization yields as a function of absolute intensity. In contrast to t
he method recently described by Walker et al. [Phys. Rev. A 57, R701 (
1998)], our method does not require any assumption on the intensity di
stribution inside a laser focus, nor does it use any mathematical proc
edure such as deconvolution that would be based on such an assumption.
In this sense, our method is self-calibrating. The proposed method im
mediately gives ion yields as a function of absolute intensity. Furthe
rmore, it allows the intensity distribution inside the focal volume to
be measured with a spatial resolution of a few mu m. The proposed met
hod uses a five-grid high-resolution reflecting time-of-flight ion spe
ctrometer, in combination with an electron spectrometer. The advanced
design of the ion spectrometer allows detection of ions originating ex
clusively from a well-defined source volume with mu m-size dimensions,
thus enabling absolute measurements of ionization probabilities and s
aturation intensities. By moving the source volume of the ion spectrom
eter through the focal region, we can quantitatively measure local ion
densities inside the focus. The corresponding spatial absolute intens
ity distribution is measured by electron-ion coincidence measurements
via the ponderomotive shifts in the electron spectrum of a suitable ta
rget gas, e.g., He. Both aspects of the proposed method (ion measureme
nts from a confined volume and intensity measurements based on pondero
motive shifts) have been successfully applied in the past. [S1050-2937
(98)09408-6].