We report on the successful monolithic integration of an InP-based pho
toreceiver operating in the narrow band around 38 GHz at a wavelength
of 1.55 mu m. The optoelectronic integrated circuit (OEIC) incorporate
s two types of high-speed devices, a submicrometer metal-semiconductor
-metal photodetector (MSM PD) made of InGaAs-InP and quarter-micromete
r high-electron-mobility-transistors (HEMT's) based on a lattice-match
ed InGaAs-InAIAs-InP layer stack. For this purpose a fabrication proce
ss requiring only twelve main steps including a metal-organic chemical
vapor deposition growth for the MSM PD layers and a MBE regrowth for
the HEMT layers has been developed, At 38 GHz, a responsivity of 3.5 A
/W for the OEIC is achieved.