MULTIFRACTAL ANALYSIS OF THE SPATIAL-DISTRIBUTION OF THE FILM SURFACES WITH DIFFERENT ROUGHENING MECHANISMS

Thin films of C-60/Ag were prepared by codeposition of C-60 and Ag ont o (001) NaCl substrates. The surface roughness depends strongly on the substrate temperature, and a transition from kinetically roughening t o thermally roughening was observed by using atomic force microscopy. Multifractal spectra of the film surfaces have been studied in the len gth scale of 30 nm to 5 mu m. Compared with the conventional root-mean -square method, the multifractal spectrum provides more information ab out the spatial distribution of the surface roughness.