MULTIFRACTAL ANALYSIS OF THE SPATIAL-DISTRIBUTION OF THE FILM SURFACES WITH DIFFERENT ROUGHENING MECHANISMS

Citation
Jg. Hou et al., MULTIFRACTAL ANALYSIS OF THE SPATIAL-DISTRIBUTION OF THE FILM SURFACES WITH DIFFERENT ROUGHENING MECHANISMS, Physical review. E, Statistical physics, plasmas, fluids, and related interdisciplinary topics, 58(2), 1998, pp. 2213-2216
Citations number
18
Categorie Soggetti
Physycs, Mathematical","Phsycs, Fluid & Plasmas
ISSN journal
1063651X
Volume
58
Issue
2
Year of publication
1998
Part
B
Pages
2213 - 2216
Database
ISI
SICI code
1063-651X(1998)58:2<2213:MAOTSO>2.0.ZU;2-3
Abstract
Thin films of C-60/Ag were prepared by codeposition of C-60 and Ag ont o (001) NaCl substrates. The surface roughness depends strongly on the substrate temperature, and a transition from kinetically roughening t o thermally roughening was observed by using atomic force microscopy. Multifractal spectra of the film surfaces have been studied in the len gth scale of 30 nm to 5 mu m. Compared with the conventional root-mean -square method, the multifractal spectrum provides more information ab out the spatial distribution of the surface roughness.