Thin films of symmetric diblock copolymers undergo a self-assembling u
pon annealing above the glass transition temperature of the components
. The multilayers organize according to the specific interactions of t
he segments with the substrate and the surface tension of the two comp
onents. These near perfect multilayers, coupled with different depth p
rofiling techniques, provide a unique and quantitative means of evalua
ting the morphology of symmetric diblock copolymers. In addition, the
surface topography of the thin film diblock copolymers and the manner
in which the topography changes with time, offers an easy means of stu
dying coarsening behavior in reduced dimensions.