PASSIVATION VERSUS ETCHING - ADSORPTION OF I-2 ON INAS(001)

Citation
Wk. Wang et al., PASSIVATION VERSUS ETCHING - ADSORPTION OF I-2 ON INAS(001), Physical review letters, 81(7), 1998, pp. 1465-1468
Citations number
24
Categorie Soggetti
Physics
Journal title
ISSN journal
00319007
Volume
81
Issue
7
Year of publication
1998
Pages
1465 - 1468
Database
ISI
SICI code
0031-9007(1998)81:7<1465:PVE-AO>2.0.ZU;2-#
Abstract
Halogen adsorption on certain III-V semiconductor surfaces forms order ed overlayers, while other surfaces etch. The microscopic mechanism un derlying this behavior is investigated by comparing the adsorption of I-2 on In- and As-terminated InAs(001) surfaces. On the In-terminated surface, a well-ordered (1 x 1) structure forms and all of the iodine attaches to In. The As-terminated surface becomes disordered, however, and iodine attaches to both In and As. These observations can be expl ained by assuming that iodine initially bonds to In atoms, whether the y are in the first or the second layer.