COMPUTATION OF THE CAPACITANCE MATRIX OF MANHATTAN GEOMETRY PLANAR CONDUCTORS EMBEDDED IN MULTILAYERED SUBSTRATES

Citation
E. Drake et al., COMPUTATION OF THE CAPACITANCE MATRIX OF MANHATTAN GEOMETRY PLANAR CONDUCTORS EMBEDDED IN MULTILAYERED SUBSTRATES, INTERNATIONAL JOURNAL OF RF AND MICROWAVE COMPUTER-AIDED ENGINEERING, 8(5), 1998, pp. 386-397
Citations number
26
Categorie Soggetti
Computer Science Interdisciplinary Applications","Engineering, Eletrical & Electronic","Computer Science Interdisciplinary Applications
ISSN journal
10964290
Volume
8
Issue
5
Year of publication
1998
Pages
386 - 397
Database
ISI
SICI code
1096-4290(1998)8:5<386:COTCMO>2.0.ZU;2-9
Abstract
In this paper we propose an efficient technique for computation of the capacitance matrix of a set of infinitely thin conductor patches embe dded in a multilayered medium. The patches present a manhattan-type sh ape, i.e., they can be subdivided into a finite number of rectangular regions. The generalized biconjugate gradient method (GBGM) in conjunc tion with FFT algorithms, is adapted to solve the convolution integral equation governing the free-charge density distribution on the conduc tors. Important computational improvements are achieved by including a symptotic extraction techniques in the determination of the space doma in periodic Green's functions. The analysis is also applied to the qua sistatic modelling of some microstrip discontinuities. (C) 1998 John W iley & Sons, Inc.