ELECTROMAGNETIC IMAGING OF ELLIPSOIDS AND ELLIPSOIDAL BOSSES

The inverse problem of determining the geometrical characteristics of a perfectly conducting ellipsoid or ellipsoidal boss from low-frequenc y scattering data is considered. It is shown that the orientation and semidiameters of the scatterer can be determined from measurements of the leading-order term in the low-frequency expansion of the electric scattering amplitude for plane wave excitation. For the ellipsoid, mea surements corresponding to six directions of incidence and associated polarization provide the necessary data, while three measurements suff ice for the ellipsoidal boss on a perfectly conducting base plane.