RECOVER THE PHASES FROM INTENSITY DATA OF X-RAY-DIFFRACTION

Authors
Citation
G. Xu, RECOVER THE PHASES FROM INTENSITY DATA OF X-RAY-DIFFRACTION, Applied physics letters, 73(7), 1998, pp. 909-911
Citations number
13
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00036951
Volume
73
Issue
7
Year of publication
1998
Pages
909 - 911
Database
ISI
SICI code
0003-6951(1998)73:7<909:RTPFID>2.0.ZU;2-W
Abstract
For many years, people believed that in conventional x-ray crystallogr aphy one can only record the scattering intensities but not the phases . In order to study structures at the atomic scale, one has to use mul tibeam measurement or to rely on additional knowledge such as bonding length and to fit the intensity data by trial structure models. In thi s letter, however, we show that the phases are in fact hidden in the i ntensity data and can be recovered by studying the peak shoulders. To demonstrate, the x-ray diffraction data of aluminum powder were used t o recover the phases and to reconstruct the electron density map. (C) 1998 American Institute of Physics.