HETEROEPITAXIAL GROWTH OF BESE ON VICINAL SI(001) SURFACES

Citation
C. Chauvet et al., HETEROEPITAXIAL GROWTH OF BESE ON VICINAL SI(001) SURFACES, Applied physics letters, 73(7), 1998, pp. 957-959
Citations number
18
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00036951
Volume
73
Issue
7
Year of publication
1998
Pages
957 - 959
Database
ISI
SICI code
0003-6951(1998)73:7<957:HGOBOV>2.0.ZU;2-L
Abstract
The growth of BeSe on vicinal Si(001) substrates has been investigated by molecular beam epitaxy. Reflection high energy electron diffractio n was used to study the initial growth mode and the surface structure. Efforts have been done at the early steps of the growth in order to o ptimize the interface quality. Transmission electron microscopy reveal ed a BeSe layer relaxed with misfit dislocations and stacking faults t hat are mainly confined near the heterointerface. These results are pr omising in view of the growth of Zn0.55Be0.45Se alloy that is lattice matched to silicon. There will be many potential applications of this alloy-in the case of a direct band gap-in the frame of Si-based optoel ectronic devices. (C) 1998 American Institute of Physics.