HYDROGEN EVOLUTION ON THIN-FILM DEPOSITED ELECTRODES PREPARED BY A PLASMA-BASED TECHNIQUE

Citation
P. Dabo et al., HYDROGEN EVOLUTION ON THIN-FILM DEPOSITED ELECTRODES PREPARED BY A PLASMA-BASED TECHNIQUE, Journal of the Electrochemical Society, 145(9), 1998, pp. 3150-3156
Citations number
23
Categorie Soggetti
Electrochemistry,"Materials Science, Coatings & Films
ISSN journal
00134651
Volume
145
Issue
9
Year of publication
1998
Pages
3150 - 3156
Database
ISI
SICI code
0013-4651(1998)145:9<3150:HEOTDE>2.0.ZU;2-R
Abstract
New electrode materials prepared by an ion-plating-like technique were characterized for hydrogen evolution reaction (HER) in 1 M ROH at 25 degrees C. The device used allows a metallic deposition under glow-dis charge conditions simultaneously with an ionic bombardment of argon. T he electrodes were tested by steady-state polarization and ac impedanc e techniques for two deposited metals: Ni and Pd. It has been found th at the HER mechanism proceeds via the Volmer-Heyrovsky pathway. Furthe rmore the morphology of the coating and the electrochemical behavior o f the electrodes were linked to both the amount and the nature of the deposited catalytic material.