COMPLEMENTARY OBSERVATIONS OF DEFECTS IN QUASI-CRYSTALS BY X-RAY TOPOGRAPHY AND ELECTRON-MICROSCOPY

Further information on defects previously [J. Gastaldi et al. Phil. Ma g. Lett. 72 (1995) 311.] observed by X-ray topography in quasicrystall ine grains, and that show a loop-shaped contrast, was obtained by comb ining this technique with electron microscopic observations and chemic al analyses. The experiments, carried out either at room temperature o r during in situ and real-time high temperature annealing, allowed to get clues on the relationships between these loop-shaped defects, the growth process of the quasicrystal grains and the defect behaviour und er the annealing treatment. (C) 1998 Elsevier Science B.V. All rights reserved.