D. Slep et al., PHASE-SEPARATION OF POLYSTYRENE AND BROMO-POLYSTYRENE MIXTURES IN EQUILIBRIUM STRUCTURES IN THIN-FILMS, Langmuir, 14(17), 1998, pp. 4860-4864
Scanning transmission X-ray microscopy (STXM), atomic force microscopy
(AFM), and dynamic secondary ion mass spectrometry (DSIMS) were used t
o obtain the true three-dimensional concentration profiles of polystyr
ene (PS) and bromo-polystyrene (PBrx=0.79S where x = fraction of monom
ers brominated) blend films as a function of PBrx=0.79S concentration.
Upon annealing, it is found that the PBrS becomes encapsulated by the
PS. The encapsulation provides for a continuous PS phase for all blen
d compositions and explains the observed structures that are formed fo
r different PBrS volume fractions. The encapsulation allows us to esti
mate the dispersive contribution of the PBrS surface energy to be less
than 20.6 dyn/cm.