NONDEGRADING PHOTOLUMINESCENCE IN POROUS SILICON

Citation
Yh. Zhang et al., NONDEGRADING PHOTOLUMINESCENCE IN POROUS SILICON, Physical review letters, 81(8), 1998, pp. 1710-1713
Citations number
21
Categorie Soggetti
Physics
Journal title
ISSN journal
00319007
Volume
81
Issue
8
Year of publication
1998
Pages
1710 - 1713
Database
ISI
SICI code
0031-9007(1998)81:8<1710:NPIPS>2.0.ZU;2-J
Abstract
Porous silicon (PS) with nondegrading photoluminescence (PL) was prepa red by a novel method. For fresh samples, the PL peak intensity is 2-2 .5 times stronger than that in normal PS. Upon exposing PS to ambient air, the PL intensity increases during the first four months and then saturates. No PL degradation is observed for eight months, and the pea k position remains unchanged. The same effect can also be achieved by annealing treatments, This PL stability is attributed to the formation of stable Fe-Si bonds on the surface of PS. Exploration of the mechan ism provides strong proof of the quantum confinement model of the lumi nescence Of PS. [S0031-9007(98)06914-2].