T. Higashi et al., EXPERIMENTAL-ANALYSIS OF TEMPERATURE-DEPENDENCE OF OSCILLATION WAVELENGTH IN QUANTUM-WELL FP SEMICONDUCTOR-LASERS, IEEE journal of quantum electronics, 34(9), 1998, pp. 1680-1689
We experimentally evaluated the temperature dependence of the oscillat
ion wavelength in 1.3-mu m GaInAsP-InP strained multiple-quantum-well
(MQW) semiconductor lasers comparing with bulk lasers, The temperature
dependence of the oscillation wavelength can be characterized newly i
ntroduced two coefficients a(1) and a(2) which are the gain peak wavel
ength shift coefficients under the constant current condition and unde
r the constant temperature condition, respectively. These two coeffici
ents of various MQW structure lasers are the same as those of bulk las
ers, This result means that the oscillation wavelength shift coefficie
nt d lambda/dT is only a function of the characteristic temperature T-
0. The higher T-0 induces the large temperature dependence of the osci
llation wavelength. When the characteristic temperature T-0 is equal t
o the characteristic temperature T-Itr, of the transparency current I-
tr, the oscillation wavelength shift coefficient d lambda/dT takes the
maximum value which is determined by the thermally induced bandgap na
rrowing effect d lambda(g)/dT. One possibility to solve the paradox be
tween a high characteristic temperature T-0 and the small temperature
dependence of the oscillation wavelength is the introduction of the te
mperature-independent leakage current.