X-RAY PHOTOELECTRON-SPECTROSCOPY STUDY OF JUNCTION INTERFACE IN IN BARBBIO FILMS/

Authors
TODA F YAMADA T KISHIDA S TOKUTAKA H
Citation
F. Toda et al., X-RAY PHOTOELECTRON-SPECTROSCOPY STUDY OF JUNCTION INTERFACE IN IN BARBBIO FILMS/, JPN J A P 1, 37(5A), 1998, pp. 2482-2484
Citations number
7
Categorie Soggetti
Physics, Applied
Journal title
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS → ACNP
Volume
37
Issue
5A
Year of publication
1998
Pages
2482 - 2484
Database
ISI
SICI code
Abstract
The In/BRBO/STO specimens were fabricated by depositing Ba0.6Rb0.4Bi1. 0Oy (BRBO) on the SrTiO3 (STO) substrates by means of molecular beam e pitaxy using 100% pure ozone and then, by depositing In metal. From th e X-ray photoelectron spectroscopy results, we found that the In metal deposited on the BRBO/STO specimen removed the oxygen from BRBO and p roduced InOx layer at the interface between In metal and BRBO.