TRANSIENT LEAKAGE CURRENT IN NEMATIC LCDS

In this paper we present the transient leakage current measurement met hod for nematic liquid crystal displays as a technique to obtain infor mation on the mobility and concentration of ionic impurities. The mobi lity depends on the temperature according to an Arrhenius-type relatio n, with an activation energy of about 0.3 eV. This dependence can be e xplained through the variation of the LC viscosity with temperature. T he transported charge has also an Arrhenius relation, with an activati on energy around 0.2 eV. Additionally, the influence of both a heat tr eatment and UV illumination on these parameters was investigated.