ANALYSIS OF TITANIUM DENTAL IMPLANTS AFTER FAILURE OF OSSEOINTEGRATION - COMBINED HISTOLOGICAL, ELECTRON-MICROSCOPY, AND X-RAY PHOTOELECTRON-SPECTROSCOPY APPROACH
A. Arys et al., ANALYSIS OF TITANIUM DENTAL IMPLANTS AFTER FAILURE OF OSSEOINTEGRATION - COMBINED HISTOLOGICAL, ELECTRON-MICROSCOPY, AND X-RAY PHOTOELECTRON-SPECTROSCOPY APPROACH, Journal of biomedical materials research, 43(3), 1998, pp. 300-312
A multitechnique approach has been used to characterize the surface of
nonosseointegrated titanium implants and the surrounding biological t
issues. Five pure titanium dental implants mere used as reference, and
25 removed implants mere studied. Surface and in-depth chemical compo
sitions of the implants (from a total of 16 patients) were investigate
d by X-ray photoelectron spectroscopy (XPS), Histological slides of th
e surrounding tissues were examined by light microscopy, XPS, and elec
tron microprobe analysis. None of the failed implants presented the re
gular surface composition and depth profile of the TiO2 overlayer; for
eign elements (Ca, Na, P, Si, Cl, Zn, Pb, and Al) were observed on som
e implants. Fibrosis, lymphocytic and plasmocytic infiltrates, and gra
nulomatous lesions were detected in the surrounding tissues. XPS and e
lectron microprobe analysis indicated the presence of Zn, Fe, Sn, and
Ti in the tissues. As a possible scenario for implant failure, we prop
ose and discuss a oxidoreduction mechanism, leading to a partial disso
lution or the complete dissociation of the protective titanium dioxide
overlayer and to ion diffusion through the surrounding tissues. (C) 1
998 John Wiley & Sons, Inc.