XPS - BINDING-ENERGY CALIBRATION OF ELECTRON SPECTROMETERS 5 - REEVALUATION OF THE REFERENCE ENERGIES

Citation
Mp. Seah et al., XPS - BINDING-ENERGY CALIBRATION OF ELECTRON SPECTROMETERS 5 - REEVALUATION OF THE REFERENCE ENERGIES, Surface and interface analysis, 26(9), 1998, pp. 642-649
Citations number
15
Categorie Soggetti
Chemistry Physical
ISSN journal
01422421
Volume
26
Issue
9
Year of publication
1998
Pages
642 - 649
Database
ISI
SICI code
0142-2421(1998)26:9<642:X-BCOE>2.0.ZU;2-C
Abstract
The binding energies of the calibration peaks for x-ray photoelectron spectroscopy-Cu 2p(3/2), Ag 3d(5/2) and Au 4f(7/2)-have been reassesse d based on the traceable data recorded in 1984 using unmonochromated x -rays and an analyser resolution of 0.3 eV. The changes in those energ ies, for different x-ray sources and analyser resolutions, have been c alculated and the results compared with further data, This includes wo rk with monochromatic Al x-rays recorded at high energy resolution, al lowing the binding energies to be referred to a new zero value set at the Fermi edge measured for Ag, A consistent set of data is presented for the calibration and assessment of photoelectron spectrometers with energy resolutions in the range 0.2-1.5 eV, when used with unmonochro mated Al or Mg x-rays or monochromated Al x-rays. (C) 1998 John Whey & Sons, Ltd.