LARGE SOLID ANGLE X-RAY PHOTOELECTRON INTENSITY DISTRIBUTIONS FROM CO, METHOXY, AND FORMATE ADSORBED ON NI(110)

Citation
A. Emundts et al., LARGE SOLID ANGLE X-RAY PHOTOELECTRON INTENSITY DISTRIBUTIONS FROM CO, METHOXY, AND FORMATE ADSORBED ON NI(110), Surface science, 410(2-3), 1998, pp. 727-735
Citations number
41
Categorie Soggetti
Chemistry Physical
Journal title
ISSN journal
00396028
Volume
410
Issue
2-3
Year of publication
1998
Pages
727 - 735
Database
ISI
SICI code
0039-6028(1998)410:2-3<727:LSAXPI>2.0.ZU;2-I
Abstract
Adsorbed layers of CO, methoxy (CH3O) and formate (HCOO) on a clean Ni (110) surface are investigated by angle-resolved X-ray photoelectron s pectroscopy. Large solid angle stereographic projections of C 1s or O 1s core level intensity measured for these adsorbates at 85 K show str ong forward scattering enhancements that unambiguously and rather dire ctly determine the molecular orientation, and in the case of CO, the o rder within the layer. CO in the (2 x 1) p2mg structure and methoxy ar e tilted by 20 degrees and 30 degrees relative to the normal, respecti vely, with the projection of the tilt in the [001] azimuth. Formate is bonded through oxygen in the bidendate configuration, aligned along t he [110] azimuth; The O-C-O bond angle is determined as 124 degrees. T hese results are in good agreement with previous data. (C) 1998 Elsevi er Science B.V. All rights reserved.