XPS AND SIMS CHARACTERIZATION OF METAL-FI LMS DEPOSITED ON POLYMERS

Authors
HINNEN C SIFFRE JM MARCUS P BEAUPREZ E RAUTUREAU G
Citation
C. Hinnen et al., XPS AND SIMS CHARACTERIZATION OF METAL-FI LMS DEPOSITED ON POLYMERS, Le Vide, (268), 1993, pp. 90-90
Citations number
NO
Categorie Soggetti
Physics, Applied
Journal title
Le Vide → ACNP
ISSN journal
12660167
Issue
268
Year of publication
1993
Supplement
S
Pages
90 - 90
Database
ISI
SICI code
1266-0167(1993):268<90:XASCOM>2.0.ZU;2-F