OPTIMIZED GATE-DRAIN FEEDBACK CAPACITANCE OF W-BAND HIGH-GAIN PASSIVATED 0.15-MU-M INALAS INGAAS HEMTS/

Citation
M. Chertouk et al., OPTIMIZED GATE-DRAIN FEEDBACK CAPACITANCE OF W-BAND HIGH-GAIN PASSIVATED 0.15-MU-M INALAS INGAAS HEMTS/, Electronics Letters, 34(17), 1998, pp. 1703-1705
Citations number
2
Categorie Soggetti
Engineering, Eletrical & Electronic
Journal title
ISSN journal
00135194
Volume
34
Issue
17
Year of publication
1998
Pages
1703 - 1705
Database
ISI
SICI code
0013-5194(1998)34:17<1703:OGFCOW>2.0.ZU;2-O
Abstract
A 0.15 mu m high gain, passivated, double-side-doped InAlAs/InGaAs HEM T with high uniformity over 2 in InP substrates has been developed. A measured gain of 12.5 dB at 94 GHz was achieved at a drain bias of 2 V , giving an f(max) exceeding 400 GHz. This high gain is mainly related to the extremely low gate-drain Feedback capacitance, for which the p hysical origins will be demonstrated. Using this technology, a single stage amplifier with 10.3 dB gain at 88 GHz and a distributed amplifie r with 11 dB gain and 89 GHz bandwidth were fabricated.