The electronic density fluctuations in polymethyl methacrylate (PMMA)
were studied by synchrotron radiation small angle X-ray scattering (SA
XS), and compared with the hole volumes as revealed by positron annihi
lation lifetime spectroscopy (PALS). The results of both methods are s
hown to be compatible with a structure of the liquid and the glass wit
h local heterogeneities of radius of the order of 0.3 nm. These micros
tructural investigations thus support the existence of density fluctua
tions in amorphous systems on a nanometer scale. (C) 1998 Elsevier Sci
ence B.V. All rights reserved.