MATERIALS DISCOVERY VIA TOPOLOGICALLY-CORRECT DISPLAY OF REDUCED-DIMENSION DATA

Authors describe and demonstrate a 'ratio-conserving' mapping procedur e for attaining reduced-dimension representations of multidimensional data. This procedure has a theoretical basis for topological correctne ss in that the ratio of the metrics in the two representations is main tained constant throughout. It is also demonstrated that comparing the reduced-dimension depiction of data with the results of clustering an d spanning tree operations in the full-dimension space can validate su ch reduced-dimension mappings. Demonstrations are carried out using a body of semiconductor data, with five independent variables and one de pendent variable. (C) 1998 Published by Elsevier Science S.A. All righ ts reserved.