ON MATRIX EFFECTS IN HF-PLASMA-SNMS ANALYSIS OF SINTERED CERAMIC TI-AL-(SI)-O

Authors
BORNER H JENETT H HODOROABA VD
Citation
H. Borner et al., ON MATRIX EFFECTS IN HF-PLASMA-SNMS ANALYSIS OF SINTERED CERAMIC TI-AL-(SI)-O, Fresenius' journal of analytical chemistry, 361(6-7), 1998, pp. 590-591
Citations number
9
Categorie Soggetti
Chemistry Analytical
Journal title
Fresenius' journal of analytical chemistry → ACNP
ISSN journal
09370633
Volume
361
Issue
6-7
Year of publication
1998
Pages
590 - 591
Database
ISI
SICI code
0937-0633(1998)361:6-7<590:OMEIHA>2.0.ZU;2-T
Abstract
For a series of electrically non-conductive, sintered ceramic samples with the nominal composition Si-0.05(AlxTi1-x)(0.95)O-y (x being varie d from 0 to 1 in steps of Delta x = 0.1), the influences of elemental concentration and of the sputtering frequency in the plasma-SNMS high frequency mode on relative sensitivity factors were investigated. For Al and Ti they show strong matrix effects which may arise from the emi ssion of positive secondary ions.