STRUCTURAL CHARACTERIZATION OF THIN-FILMS FORMED OR CHANGED ON MATERIALS BY MICRO-RAMAN SPECTROSCOPY

Authors
WITKE K BRZEZINKA KW REICH P
Citation
K. Witke et al., STRUCTURAL CHARACTERIZATION OF THIN-FILMS FORMED OR CHANGED ON MATERIALS BY MICRO-RAMAN SPECTROSCOPY, Fresenius' journal of analytical chemistry, 361(6-7), 1998, pp. 619-620
Citations number
11
Categorie Soggetti
Chemistry Analytical
Journal title
Fresenius' journal of analytical chemistry → ACNP
ISSN journal
09370633
Volume
361
Issue
6-7
Year of publication
1998
Pages
619 - 620
Database
ISI
SICI code
0937-0633(1998)361:6-7<619:SCOTFO>2.0.ZU;2-N
Abstract
Micro Raman spectroscopy is shown as a useful method of high spatial r esolution in characterization of thin films on or in materials formed or changed as a result of external influences. Identification of black films in the glaze of porcelain, of impairing deposits on components of an ICP mass spectrometer and of tribologically stressed contacts of ADLC films or (Ti,Mo)(C,N) ceramics, respectively, are examples for a pplication.