INVESTIGATION OF DIVERGENT BEAM X-RAY REFLEX SECTIONS ESPECIALLY INDICATION BY COMPUTER-SIMULATION AND ASSIGNMENT TO THE GRAINS IN POLYCRYSTALLINE SAMPLES

The divergent beam X-ray interference (DBI) method is commonly used to determine crystal systems, crystallographic orientation and lattice c onstants of single crystals and large individual grains and to get inf ormation on the real structure. Here back reflection divergent beam X- ray interference patterns (Pseudo-KOSSEL technique) were taken from po lycrystalline specimens in the SEM and compared with corresponding lat tice source interference (LSI) patterns (KOSSEL technique). A simulati on program (for DBI) was developed allowing the calculation and indica tion of the complete reflex system as well as reflex sections. Reflex interruptions were obtained and could be explained by grain boundary e ffects. The influence of different important parameters such as the di stance beween the target and the specimen, the target material, the or ientation, the position, the shape and the size of the grains were dis cussed. Conclusions with respect to a local assignment of interruption s to grain boundaries are drawn so that now there is a possibility to localize the observed crystal defects.