Vp. Afanasev et al., EFFECT OF THE BOTTOM ELECTRODE ON THE FORMATION OF THE PEROVSKITE PHASE IN LEAD-ZIRCONATE-TITANATE FILMS, Crystallography reports, 43(2), 1998, pp. 322-325
Microtopographic studies of the surface morphology are conducted out f
or platinum films obtained under various deposition and heat treatment
conditions. The effect of the microrelief of the bottom platinum elec
trode on the formation of the perovskite phase in submicron lead-zirco
nate-titanate (Pb-Zr-Ti) films is studied. It is shown that the use of
a smooth platinum sublayer allows one to obtain single-phase Pk-Zr-Ti
films with a thickness less than 100 nm. The properties of Pb-Zr-Ti f
ilms as elements of capacitor structures with platinum electrodes are
studied.