NEW METHOD FOR MEASURING CRYSTAL CURVATURE ON A 3-CRYSTAL X-RAY DIFFRACTOMETER

Authors
MALTSEV YF GARKUSHEV EN NIKIFOROV IY
Citation
Yf. Maltsev et al., NEW METHOD FOR MEASURING CRYSTAL CURVATURE ON A 3-CRYSTAL X-RAY DIFFRACTOMETER, Crystallography reports, 43(2), 1998, pp. 326-326
Citations number
NO
Categorie Soggetti
Crystallography
Journal title
Crystallography reports → ACNP
ISSN journal
10637745
Volume
43
Issue
2
Year of publication
1998
Pages
326 - 326
Database
ISI
SICI code
1063-7745(1998)43:2<326:NMFMCC>2.0.ZU;2-Q
Abstract
A method for measuring the curvature of single crystals on a triple-cr ystal X-ray diffractometer has been developed for the Bragg geometry. The divergence of the X-ray radiation from the third crystal (a specim en) is determined by the angle formed by the tangents at the points of incidence of the end rays of the beam incident onto a bent crystal. A formula is obtained that relates the width of a diffraction maximum t o the curvature radius of the crystal studied.