Vt. Bublik et al., A METHOD FOR EVALUATING STRUCTURAL AND CHEMICAL INHOMOGENEITY IN COARSE-GRAINED INGOTS OF TERNARY BI-SB-TE SOLID-SOLUTIONS, Crystallography reports, 43(3), 1998, pp. 505-510
Coarse-grained ingots of ternary solid solutions of composition Bi0.5S
b1.5Te3 + 5 wt % Te with the p-type conductivity are studied. The ingo
ts were grown by vertical zone melting, with annealing for 140 hours a
t 380-400 degrees C. A set of experimental techniques is proposed for
the characterization of the microstructure and the homogeneity of the
ingots including X-ray diffraction, optical metallographic in polarize
d light, microhardness and reflectivity measurements, and X-ray spectr
al microprobe analysis. These techniques are used for estimating the e
ffect of the growth conditions and subsequent thermal treatment on the
characteristics of the materials under study.