STRUCTURE OF ORDERED POLYELECTROLYTE FILMS FROM ATOMIC-FORCE MICROSCOPY AND X-RAY REFLECTIVITY DATA

The possible application of atomic-force microscopy and X-ray reflecto metry methods to structural studies of polyelectrolyte films obtained due to alternating adsorption of oppositely charged polyanion [sodium polysterenesulfonate (PSS)] and polycation [poly(allylamine) hydrochlo ride (PAA)] layers on solid substrates has been considered. The atomic -force microscopy study has revealed the characteristic features of th e surface topography of samples consisting of different numbers of pol yelectrolyte layers deposited from solutions characterized by differen t ionic strength values. It is shown that the shape of the reflectivit y curves obtained from thin polyelectrolyte films depends on their sur face structure.