XANES OF SIXFOLD SILICON IN MOO3-SIO2-P2O5 GLASSES

Citation
S. Muthupari et Me. Fleet, XANES OF SIXFOLD SILICON IN MOO3-SIO2-P2O5 GLASSES, Journal of non-crystalline solids, 238(3), 1998, pp. 259-265
Citations number
32
Categorie Soggetti
Material Science, Ceramics
ISSN journal
00223093
Volume
238
Issue
3
Year of publication
1998
Pages
259 - 265
Database
ISI
SICI code
0022-3093(1998)238:3<259:XOSSIM>2.0.ZU;2-C
Abstract
Glasses of the ternary MoO3-SiO2-P2O5 system have been prepared by mel t quenching in air and studied using Si K-edge X-ray absorption near-e dge structure (XANES) spectroscopy to estimate proportion of sixfold c o-ordinated silicon. Sixfold Si is detectable in most glasses prepared with molar (MoO3 + SiO2) > P2O5. The proportion of sixfold Si increas es from 0% to 49% of total Si atoms with increase in P2O5 content. Our results indicate, for the first time, the presence of sixfold Si in a lkali- and alkaline-earth-free silicophosphate ternary glasses, and st rongly favor the view that alkali and alkaline-earth modifiers are not necessary to stabilize sixfold Si in silicophosphate glasses. In tern ary MoO3-SiO2-P2O5 composition space, isopleths of proportion of sixfo ld Si trend parallel to the MoO3-SiO2 join and indicate that the terna ry glass structure is comprised of separate molybdophosphate and silic ophosphate entities. (C) 1998 Elsevier Science B.V. All rights reserve d.