STRUCTURE OF NITRIDE FILM HARD COATINGS PREPARED BY REACTIVE MAGNETRON SPUTTERING

Citation
R. Manaila et al., STRUCTURE OF NITRIDE FILM HARD COATINGS PREPARED BY REACTIVE MAGNETRON SPUTTERING, Applied surface science, 134(1-4), 1998, pp. 1-10
Citations number
24
Categorie Soggetti
Physics, Applied","Physics, Condensed Matter","Chemistry Physical","Materials Science, Coatings & Films
Journal title
ISSN journal
01694332
Volume
134
Issue
1-4
Year of publication
1998
Pages
1 - 10
Database
ISI
SICI code
0169-4332(1998)134:1-4<1:SONFHC>2.0.ZU;2-S
Abstract
TiN, Ti1-xAlxN and ZrN films were deposited by electron-beam- assisted de magnetron sputtering. X-ray diffraction showed different degrees o f texture, depending on substrate bias, temperature and composition. I n TiN films deposited with a high bias, microstructure changes were ev idenced from lattice parameter trends, attributable to Ar inclusions. Ti1-xAlxN cubic solid solutions showed an average x = 0.10. In ZrN fil ms, a rhombohedrally-distorted phase is present, besides the cubic one . (C) 1998 Elsevier Science B.V. All rights reserved.