R. Manaila et al., STRUCTURE OF NITRIDE FILM HARD COATINGS PREPARED BY REACTIVE MAGNETRON SPUTTERING, Applied surface science, 134(1-4), 1998, pp. 1-10
Citations number
24
Categorie Soggetti
Physics, Applied","Physics, Condensed Matter","Chemistry Physical","Materials Science, Coatings & Films
TiN, Ti1-xAlxN and ZrN films were deposited by electron-beam- assisted
de magnetron sputtering. X-ray diffraction showed different degrees o
f texture, depending on substrate bias, temperature and composition. I
n TiN films deposited with a high bias, microstructure changes were ev
idenced from lattice parameter trends, attributable to Ar inclusions.
Ti1-xAlxN cubic solid solutions showed an average x = 0.10. In ZrN fil
ms, a rhombohedrally-distorted phase is present, besides the cubic one
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