GRAZING-INCIDENCE SMALL-ANGLE X-RAY-SCATT ERING - A SUITABLE METHOD FOR THE STUDY OF AGGREGATES

Authors
NAUDON A THIAUDIERE D ARNAULT JJ DELAFOND J TEMPLIER C
Citation
A. Naudon et al., GRAZING-INCIDENCE SMALL-ANGLE X-RAY-SCATT ERING - A SUITABLE METHOD FOR THE STUDY OF AGGREGATES, Comptes rendus de l'Academie des sciences. Serie 2, Mecanique, physique, chimie, sciences de l'univers, sciences de la terre, 317(10), 1993, pp. 1275-1278
Citations number
9
Categorie Soggetti
Multidisciplinary Sciences
Journal title
Comptes rendus de l'Academie des sciences. Serie 2, Mecanique, physique, chimie, sciences de l'univers, sciences de la terre → ACNP
ISSN journal
07644450
Volume
317
Issue
10
Year of publication
1993
Pages
1275 - 1278
Database
ISI
SICI code
0764-4450(1993)317:10<1275:GSXE-A>2.0.ZU;2-K
Abstract
The possibility of studying gold aggregates obtained by ion sputtering on the flat surface of a silicon wafer is shown when using small-angl e scattering under grazing incidence. Such a technique, associated wit h atomic force microscopy in the resonant mode, allows to obtain accur ate morphological information on the first stages of thin layer format ion.