Rw. Fonda et De. Luzzi, HIGH-RESOLUTION ELECTRON-MICROSCOPY OF THE SIGMA=5 [001] (310) GRAIN-BOUNDARY IN NIAL, Philosophical magazine. A. Physics of condensed matter. Defects and mechanical properties, 68(6), 1993, pp. 1151-1164
The structure of a highly oriented NiAl Sigma=5 [001](310) grain bound
ary has been imaged by high-resolution electron microscopy and analyse
d by multislice image calculations. This grain boundary exhibits an as
ymmetry produced by a rigid body displacement of approximately 1/2d(1(
3) over bar0$) along the grain boundary, but does not show any measura
ble expansion of the grain boundary. The match between the simulated a
nd experimental images of this grain boundary is improved by changing
the stoichiometry of the boundary, which can be accomplished by adding
antisite defects and vacancies. The final model structure incorporate
s 50% constitutional vacancies on the nickel sites adjacent to the bou
ndary plane and a replacement of the aluminium sites adjacent to the b
oundary plane with 50% nickel antisite defects and 50% vacancies.